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Application US20190310316

OPTIMIZED TESTING OF QUANTUM-LOGIC CIRCUITS

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US20190310316

1. A quantum-logic test-development system comprising a processor, a memory coupled to the processor, and a computer-readable hardware storage device coupled to the processor, the storage device containing program code configured to be run by the processor via the memory to implement a method for reducing complexity when testing quantum-logic circuits, the method comprising: (1) (2)

8. A method for reducing complexity when testing quantum-logic circuits, the method comprising: (2) (2)
 

16. A computer program product, comprising a computer-readable hardware storage device having a computer-readable program code stored therein, the program code configured to be executed by a quantum-logic test-development system comprising a processor, a memory coupled to the processor, and a computer-readable hardware storage device coupled to the processor, the storage device containing program code configured to be run by the processor via the memory to implement a method for reducing complexity when testing quantum-logic circuits, the method comprising: (1) (2)



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